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July 14, 2016 08:15 ET | Source: FEI Company

FEI’s New Themis Z S/TEM Sets New Standards for High Performance Imaging and Analysis

HILLSBORO, Ore., July 14, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today released its new Themis™ Z scanning/transmission electron microscope (S/TEM), once again raising the bar for imaging and...
May 11, 2011 08:20 ET | Source: FEI Company

Photo Release -- FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center

HILLSBORO, Ore. and SAN SEBASTIAN, Spain, May 11, 2011 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research...