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December 01, 2022 03:05 ET | Source: Advantest America, Inc.

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects

TOKYO, Dec. 01, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope (DR-SEM),...
September 18, 2019 03:05 ET | Source: Advantest America, Inc.

Advantest to Showcase E-Beam Lithography Solutions at 45th Micro & Nanoengineering (MNE) Show in Rhodes, Greece on September 23-26

MUNICH, Germany, Sept. 18, 2019 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its F7000 electron-beam (EB) lithography system and...