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October 24, 2018 03:05 ET | Source: Advantest America, Inc.

Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories

New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...