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February 12, 2025 03:05 ET | Source: Advantest America, Inc.

Advantest Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM Devices

TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge...
November 29, 2022 03:05 ET | Source: Advantest America, Inc.

Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICs

TOKYO, Nov. 29, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has launched inteXcell, a new line of minimal-footprint test cells designed...
October 24, 2018 03:05 ET | Source: Advantest America, Inc.

Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories

New B6700L Tester Expands the Platform’s Temperature Range While B6700S System Offers Zero-Footprint Configuration TOKYO, Oct. 24, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment...
October 10, 2018 03:05 ET | Source: Advantest America, Inc.

Advantest Launches Newest Memory Burn-In Tester to Meet Growing Global Demand for NAND Flash and DRAM Devices

TOKYO, Oct. 10, 2018 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation B6700D memory burn-in tester to meet...