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HILLSBORO, Ore., Aug. 31, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today announced a milestone of the 1,000th Helios™ DualBeam system shipped since the product family was introduced in 2006. The...

HILLSBORO, Ore., Aug. 30, 2016 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC) today announced that at the special meeting of FEI’s shareholders held on August 30, 2016, its shareholders...

Fast, sophisticated automation and advanced 3D imaging workflows allow applied researchers to focus on scientific questions rather than microscope operation. HILLSBORO, Ore., Aug. 22, 2016 (GLOBE...

HILLSBORO, Ore., Aug. 04, 2016 (GLOBE NEWSWIRE) -- FEI Company (Nasdaq:FEIC) today reported results for the second quarter of 2016.  Second quarter revenue of $259 million was up 16% compared...

HILLSBORO, Ore., July 14, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today released its new Themis™ Z scanning/transmission electron microscope (S/TEM), once again raising the bar for imaging and...

HILLSBORO, Ore., June 27, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) continues to lead the industry with the launch of the Helios™ G4 DualBeam Series for materials science, offering highly automated...

HILLSBORO, Ore., June 16, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor...

HILLSBORO, Ore., June 09, 2016 (GLOBE NEWSWIRE) -- FEI Company (NASDAQ:FEIC) announced that its board of directors has approved payment of a quarterly dividend of $0.30 per share of common...

HILLSBORO, Ore., May 04, 2016 (GLOBE NEWSWIRE) -- FEI Company (NASDAQ:FEIC) today reported results for the first quarter of 2016.  First quarter revenue of $229 million was up 3.5% compared...

HILLSBORO, Ore., May 03, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) today announced the new Apreo™ scanning electron microscope (SEM), offering an industry-leading range of applications. In fields...